Solutions
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CX-E100/E200 X-ray Intelligent Inspection Equipment
- Used for detecting internal defects in devices such as PCB, PCBA, SMT assembly, IC, BGA, CSP, MEMS, flip-chip, LED chips, IGBT, FPC soft boards, electronic connectors, semiconductors, and in the electronic industry, as well as internal defects in new energy batteries.
- BGA defects: voids, insufficient solder, bridging, misalignment, open circuits, solder splashes, cold solder joints, and pillow defects.
- Defects in semiconductor products (such as ICs and IGBTs): bond wire detachments, collapsed lines, and necking defects.
- New energy battery defects: layer count, voltage irregularities, ohmic resistance, and tilt angle defects.
- Welding defects in new energy and automotive electronics FPC soft boards: pad misalignment, bubbles, etc.
- Internal welding and assembly defects in products such as LEDs, electronic connectors, and fuses.
Functions:
- 90KV/130KV Closed Integrated X-ray Source, Long Lifespan, Maintenance-Free
- Detector with 60° Tilt Angle for Rotational Inspection
- CNC Automatic Programming Function
- CCD Window Navigation for Testing Position
- Rich Detection Tools: Distance, Angle, Polygon Area Definition, Solder (Bubbles) Area Statistics
- Automatic Determination of Non-Conforming Products
Advantages:
- Integrated AI Deep Learning Algorithms
- Customizable Detection Content Development
- Industry-Leading Image Enhancement
- Self-Shielding Enclosure with Safety Interlock Mechanism, Real-Time Radiation Monitoring, Less Than 1 μSv/h
Specs:
| Item | Parameters | |
| Model | CX-E100 | CX-E200 |
| Maximum Tube Voltage | 90 KV | 130KV |
| Maximum Tube Current | 0.2mA | 0.3mA |
| Focus Size | 5μm | 5μm |
| Pixel Pitch | 85μm | |
| Image Size | 130x130mm | |
| Minimum Resolution | 5~7μm | |
| Maximum Field of View (FOV) | 65x65mm | |
| Detection Area | 500x450mm | |
| Stage Rotation | N/A | 360° Rotation |
| Dimensions | 1390(L)x1390(D)x1900(H) mm | |
| Weight | 1800 kg | |
