Solutions
Premium, flexible, and reliable solutions that tackle productivity challenges and boost your manufacturing capacity.
Micro Semiconductor Chip Test Equipment
Primarily used in face recognition modules or AR/VR optical devices optical power, optical wavelength, optical energy density and other photoelectric performance tests. Flexible to be customized with linear automation line multi-station test support 4~16 station simultaneous testing.
Functions:
- Fully automatic loading and unloading machine
- 4 nozzles design, high speed PNP with camera positioning, high UPH
- Unloading the tested DUT with different BlN info.
- Control the test temperature precisely
- Flexible design of test station, compatible with various test requirements
Specs:
| Item | Parameters |
| UPH | 1000-2000 |
| Positioning Accuracy | ±0.01mm |
| Jam Rate | 1/5000 |